-Fremont, CA November 14th, 2003-

NIDEK Inc. announced today that several of its diagnostic products and solutions would have added features and capabilities introduced in the coming weeks. These added enhancements and features would strengthen and secure NIDEK’s leadership position in the area of digital- and software-enabled diagnostic solutions for the vision care professional and the industry at large. These added capabilities and features will be released and promoted by NIDEK at this year’s American Academy of Ophthalmology (AAO) meeting in Anaheim, California from November 15 to 18.

“We are introducing several new capabilities and clinical applications to many of our diagnostic products and solutions at this year’s AAO Meeting in Anaheim, California. These will include the NAVIS Software, the NIDEK 3-Dx Digital Stereo Fundus Camera, and the NIDEK OPD-Scan. With added features and capabilities, NIDEK’s diagnostic instruments will offer the vision care professional even more valuable information for their clinical and practice needs.” stated Mr. Ted Shimomura, Executive Vice-President & General Manager of NIDEK Inc.

The NAVIS Information System Software for example, will feature the added capability of measuring cup-to-disk ratios. This information is ideal for the assessment and diagnosis of glaucoma and macular edema. The NAVIS Software also features advanced patient data management, image data management, and other collaborative applications for the busy ophthalmic practice.

NIDEK will also launch the 6 mega-pixel stereo fundus camera – NIDEK 3-Dx Digital Camera. The unit will allow the operator to take repeatable simultaneous stereo color images of the optic disc, fundus, and external eye with just one-shot – all in digital format. This device is also ideal for the assessment and diagnosis of glaucoma, macula edema, and other retinal diseases and pathologies. The NIDEK 3-Dx Digital Camera also offer the user the use of NAVIS – 3-D digital imaging and communication software, which enables the user to access stored images and files.

NIDEK’s OPD-Scan will also get additional capabilities and functionality. The auto-refractor, wavefront analyzer, and topographer will now provide point spread function diagnostic data and analysis. This feature will enhance the functionality and diagnostic capability of the unit for wavefront measurements and various diagnostic applications.

“With all these added features and functionalities, NIDEK continues to provide excellent capabilities with its strong diagnostic products and imaging solutions. We are committed to offering our users the best solutions for their diagnostic and practice needs. NIDEK’s R&D and Product Development initiatives are focused on offering our users excellent features and functionalities for their current and our new products,” added Mr. Ted Shimomura. With a keen eye on offering advanced high-tech diagnostic products, NIDEK is strengthening its strong and robust product offering in the area of ophthalmic diagnostics and imaging solutions. “With all these capabilities and added features, NIDEK continues to offer advanced diagnostic solutions to meet specific practice and clinical needs,” added Mr. Shimomura.

NIDEK will exhibit the above-mentioned products and other diagnostic and laser solutions at the AAO 2003 Meeting in Anaheim, California. NIDEK’s booth number is 2561.

Contact:
Ms. Hiromi Kitagawa
Public Relations, Planning Dept.
Phone: +81-533-67-6753
Fax: +81-533-67-6610
Email: info@nidek.co.jp