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Event 2018

SIOF / China (Shanghai) International Optical Fair

SIOF / China (Shanghai) International Optical Fair has ended in a great success.
Thank you for your visit.

NIDEK will showcase our innovative products at SIOF 2018 in Shanghai, China.
We cordially invite you to visit our booth and evaluate these exceptional devices.

General Information

China (Shanghai) International Optical Fair

Event Date5 - 7th March, 2018
Exhibition Date5 - 7th March, 2018
VenueShanghai World Expo Exhibition and Convention Center
Nidek Booth2G02

Exhibits

Lens Edger

Multifunction Edger Me 1200
Patternless Edger LEX-1200
Patternless Edger LE-1200
Edging Station LE-700

Industrial Edger

System Edger SE-9090 Supra

Peripheral

Intelligent Blocker ICE-1200
Centering Device CE-9
Satellite Tracer LT-1200
Satellite Tracer LT-980

Refraction

Refractive Power / Corneal Analyzer  OPD Scan lll VS
Auto Ref / Kerato / Tono / Pachymeter TONOREF™ III
Auto Ref / Keratometer ARK-1/AR-1
Handheld Ref HandyRef
Intelligent Refractor RT-5100
Intelligent Refractor RT-3100
Refractor RT-600
Tabletop Refraction System TS-310
Space Saving Chart SSC-370
Chart Projecttor CP-770
Auto Lensmeter LM-1800PD / 1800P
Auto Lensmeter LM-7
Auto Lensmeter LM-600PD / 600P / 600
Auto Lensmeter LM-500

Diagnostic

Specular Microscope CEM-530
Optical Biometer  AL-Scan

If you have any questions, please feel free to contact NIDEK at marketing@nidek.co.jp.
We look forward to seeing you at our booth.

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