NIDEK launches AL-Scan and CEM Viewer for NAVIS-EX

2015.10.17

-October 7, 2015, Gamagori, Japan-

 

NIDEK CO., LTD., a global leader in the design, manufacturing, and distribution of ophthalmic, optometric, and lens edging equipment, is pleased to announce the launch of the AL-Scan and CEM Viewer for NAVIS-EX.

The AL-Scan / CEM Viewer for NAVIS-EX are viewing software packages for the AL-Scan, optical biometer / CEM-530, specular microscope. The viewing software allows viewing, calculations, and processing of data within NAVIS-EX after measurement with either instrument. The NAVIS-EX is an image filing software that enables data from various NIDEK diagnostic devices to be stored in a centralized database.

With the AL-Scan Viewer, an unlimited NAVIS-EX database is available for reviewing AL-Scan measurement data on an external computer. Data can be recalculated and various parameters can be modified including axial length, white-to-white, and pupil size for precise IOL power calculations. Multiple toric lens assist images can be displayed for selecting the optimal image for digital astigmatic axis marking for toric IOL surgery. The basic functions of the AL-Scan including IOL power calculations can be performed on the AL-Scan Viewer.

With the CEM Viewer, an unlimited NAVIS-EX database is available for reviewing CEM-530 measurement data on an external computer. Data can be reviewed for progression over time with multiple examination and two data sets can be compared for monitoring endothelial changes over time. Images and analyses of the paracentral and peripheral areas can be displayed for a comprehensive image of endothelial cells. The basic functions of the CEM-530 including endothelial cell count can be performed on the CEM Viewer.

The respective Viewer software packages enhance the capability of the AL-Scan / CEM-530 with additional features to increase clinical efficiency.

 

AL-Scan: https://www.nidek-intl.com/product/ophthaloptom/diagnostic/dia_cornea/al-scan.html
CEM-530: https://www.nidek-intl.com/product/ophthaloptom/diagnostic/dia_cornea/cem-530.html

 

 

For further information contact:
Public Relations, Planning Dept.
NIDEK CO., LTD.
Email: info@nidek.co.jp

 

NOTE: The availability of the products differs from country to country depending on the status of regulatory approval in each country. Specifications and design are subject to change without notice.

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